Parcourir 2015 fascicula9 nr2 par sujet "conductive atomic force microscopy"

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Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent thin Films

Alexa, A.; Pimentel, T.; Calmeiro, A.; Istrate, A.; Fortunato, E.; Mușat, V. (Universitatea "Dunărea de Jos" din Galați, 2015)

The paper presents the investigation by conductive-atomic force microscopy (C-AFM) of the variation of the local conductivity and topography of the transparent ZnO thin films deposed onto soda lima glass substrates by ...