Preparation and Characterization of Tin Oxide thin Films

Abstract

Tin oxide (SnO) thin films were prepared onto glass substrates by thermal evaporation under vacuum. The substrate temperature was kept constant at 300 K during the film growth. The structural studies using transmission electron microscopy (TEM) analysis showed that the SnO thin films have a polycrystalline and tetragonal crystal structure with preferential orientation of (110) planes parallel to the substrate. Optical transmission and reflection spectra, at normal incidence, in the spectral range 300-1100 nm, are investigated. The optical properties of SnO thin films were determined. The optical energy band gap, Eg, has been estimated from the absorption coefficient values using Tauc’s procedure. It is found that the SnO thin films exhibit direct band gap.